Coverart for item
The Resource Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride, George Y. Baaklini, James D. Kiser, and Don J. Roth, (microform)

Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride, George Y. Baaklini, James D. Kiser, and Don J. Roth, (microform)

Label
Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride
Title
Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride
Statement of responsibility
George Y. Baaklini, James D. Kiser, and Don J. Roth
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
GPO
http://library.link/vocab/creatorName
Baaklini, George Y
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Kiser, James D
  • Roth, Don J
  • United States
Series statement
NASA technical memorandum
Series volume
86945
http://library.link/vocab/subjectName
  • Detection
  • Radiography
  • Reaction bonding
  • Sensitivity
  • Silicon carbides
  • Silicon nitrides
Label
Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride, George Y. Baaklini, James D. Kiser, and Don J. Roth, (microform)
Instantiates
Publication
Base of film
safety base undetermined
Carrier category
microfiche
Carrier category code
he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm265697166
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
1 volume .
Form of item
microfiche
Generation
service copy
Media category
microform
Media MARC source
rdamedia
Media type code
h
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
Stock number
N 85-21674
System control number
  • (GPO)99258442
  • (OCoLC)265697166
  • (GPO)99258442
  • (Sirsi) a961557
Label
Radiographic detectability limits for seeded voids in sintered silicon carbide and silicon nitride, George Y. Baaklini, James D. Kiser, and Don J. Roth, (microform)
Publication
Base of film
safety base undetermined
Carrier category
microfiche
Carrier category code
he
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm265697166
Dimensions
4x6 in. or 11x15 cm.
Emulsion on film
diazo
Extent
1 volume .
Form of item
microfiche
Generation
service copy
Media category
microform
Media MARC source
rdamedia
Media type code
h
Positive negative aspect
negative
http://bibfra.me/vocab/marc/reductionRatio
02
ReductionRatioRange
normal reduction
Reproduction note
Microfiche.
Specific material designation
microfiche
Stock number
N 85-21674
System control number
  • (GPO)99258442
  • (OCoLC)265697166
  • (GPO)99258442
  • (Sirsi) a961557

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      29.759431 -95.369953
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