Coverart for item
The Resource P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions, Nikolaus Dietz and Klaus J. Bachmann, (microform)

P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions, Nikolaus Dietz and Klaus J. Bachmann, (microform)

Label
P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions
Title
P-polarized reflectance spectroscopy
Title remainder
a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions
Statement of responsibility
Nikolaus Dietz and Klaus J. Bachmann
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
GPO
http://library.link/vocab/creatorName
Dietz, Nikolaus
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Bachmann, Klaus J
  • United States
Series statement
NASA contractor report
Series volume
NASA CR-199715
http://library.link/vocab/subjectName
  • Dielectric properties
  • Epitaxy
  • Film thickness
  • Fine structure
  • Laser applications
  • Light scattering
  • Spectral reflectance
  • Spectroscopy
  • Surface layers
Label
P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions, Nikolaus Dietz and Klaus J. Bachmann, (microform)
Instantiates
Publication
Note
  • Distributed to depository libraries in microfiche
  • Shipping list no.: 96-0197-M
Carrier category
microform
Carrier MARC source
local
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm34603011
Extent
1 volume .
Form of item
microfiche
Media category
microform
Media MARC source
rdamedia
Media type code
h
Reproduction note
Microfiche.
Stock number
N 96-14602
System control number
  • (GPO)96068814
  • (OCoLC)34603011
  • (GPO)96068814
  • (Sirsi) a558129
Label
P-polarized reflectance spectroscopy : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions, Nikolaus Dietz and Klaus J. Bachmann, (microform)
Publication
Note
  • Distributed to depository libraries in microfiche
  • Shipping list no.: 96-0197-M
Carrier category
microform
Carrier MARC source
local
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm34603011
Extent
1 volume .
Form of item
microfiche
Media category
microform
Media MARC source
rdamedia
Media type code
h
Reproduction note
Microfiche.
Stock number
N 96-14602
System control number
  • (GPO)96068814
  • (OCoLC)34603011
  • (GPO)96068814
  • (Sirsi) a558129

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      29.759431 -95.369953
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