Coverart for item
The Resource Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques, George C. Harman, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards

Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques, George C. Harman, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards

Label
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques
Title
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques
Statement of responsibility
George C. Harman, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
TRL
http://library.link/vocab/creatorName
Harman, George G
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Center for Electronics and Electrical Engineering (U.S.)
  • United States
Series statement
  • Semiconductor measurement technology
  • NBS special publication ; 400-59
http://library.link/vocab/subjectName
  • Semiconductors
  • Acoustic emission
Label
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques, George C. Harman, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards
Instantiates
Publication
Note
  • Sponsored in part by the Defense Advanced Research Projects Agency
  • Issued Sept. 1979
  • CODEN: XNBSAV
Bibliography note
Includes bibliographical references
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm5535581
Dimensions
26 cm.
Extent
v, 66 pages
Lccn
79600131
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations
System control number
  • (GPO)80003981
  • (OCoLC)5535581
  • (GPO)80003981
  • (Sirsi) a352720
Label
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques, George C. Harman, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards
Publication
Note
  • Sponsored in part by the Defense Advanced Research Projects Agency
  • Issued Sept. 1979
  • CODEN: XNBSAV
Bibliography note
Includes bibliographical references
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm5535581
Dimensions
26 cm.
Extent
v, 66 pages
Lccn
79600131
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations
System control number
  • (GPO)80003981
  • (OCoLC)5535581
  • (GPO)80003981
  • (Sirsi) a352720

Library Locations

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      29.759431 -95.369953
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