Coverart for item
The Resource Electronic characterization of defects in narrow gap semiconductors : final report, November 25, 1992 to November 25, 1994, James D. Patterson, (microform)

Electronic characterization of defects in narrow gap semiconductors : final report, November 25, 1992 to November 25, 1994, James D. Patterson, (microform)

Label
Electronic characterization of defects in narrow gap semiconductors : final report, November 25, 1992 to November 25, 1994
Title
Electronic characterization of defects in narrow gap semiconductors
Title remainder
final report, November 25, 1992 to November 25, 1994
Statement of responsibility
James D. Patterson
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
GPO
http://library.link/vocab/creatorDate
1934-
http://library.link/vocab/creatorName
Patterson, James D.
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
George C. Marshall Space Flight Center
Series statement
NASA contractor report
Series volume
NASA CR-197217
http://library.link/vocab/subjectName
  • Impurities
  • Interstitials
  • Mercury cadmium tellurides
  • Mercury tellurides
  • Semiconductors (materials)
  • Vacancies (crystal defects)
  • Zinc selenides
  • Zinc tellurides
Label
Electronic characterization of defects in narrow gap semiconductors : final report, November 25, 1992 to November 25, 1994, James D. Patterson, (microform)
Instantiates
Publication
Note
  • Distributed to depository libraries in microfiche
  • Shipping list no.: 95-0270-M
Carrier category
microform
Carrier MARC source
local
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm32826016
Extent
1 volume .
Form of item
microfiche
Media category
microform
Media MARC source
rdamedia
Media type code
h
Reproduction note
Microfiche.
Stock number
N 95-15752
System control number
  • (GPO)95078843
  • (OCoLC)32826016
  • (GPO)95078843
  • (Sirsi) a541267
Label
Electronic characterization of defects in narrow gap semiconductors : final report, November 25, 1992 to November 25, 1994, James D. Patterson, (microform)
Publication
Note
  • Distributed to depository libraries in microfiche
  • Shipping list no.: 95-0270-M
Carrier category
microform
Carrier MARC source
local
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
ocm32826016
Extent
1 volume .
Form of item
microfiche
Media category
microform
Media MARC source
rdamedia
Media type code
h
Reproduction note
Microfiche.
Stock number
N 95-15752
System control number
  • (GPO)95078843
  • (OCoLC)32826016
  • (GPO)95078843
  • (Sirsi) a541267

Library Locations

    • Central Library, Jesse H. Jones BuildingBorrow it
      500 McKinney St., Houston, TX, 77002, US
      29.759431 -95.369953
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